<pre id="1wde5"><small id="1wde5"></small></pre>
<strike id="1wde5"></strike>

<big id="1wde5"><em id="1wde5"></em></big>

      <code id="1wde5"></code>
    1. <output id="1wde5"><small id="1wde5"><p id="1wde5"></p></small></output>
      <object id="1wde5"><sup id="1wde5"><mark id="1wde5"></mark></sup></object>

    2. <nav id="1wde5"><video id="1wde5"></video></nav>
      1. +86 532 8281 2277
        Current: Products> Laboratory Equipment > >Digital LCD metallurgical microscope
        Digital LCD metallurgical microscope
        Quick Details
        • Place of Origin:
        • Shandong, China (Mainland)
        • Brand Name:
        • HIPROVE
        • Model Number:
        • HIP-XJP-607
        • Theory:
        • Metallurgical Microscope
        • Drawtube:
        • Binocular
        • Certificate:
        • CE ISO
        • Model:
        • XJP-607
        • Microscope type:
        • industrial microscope
        •  
        Packaging & Delivery
        • Packaging Details:
        • wooden
        • Delivery Time:
        • 7 days after payment
        Product Description

        HIP-XJP-607 Industrial Metallurgical microscope is developed and aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry. Used as an advanced Metallurgical microscope, the user can experience its super performance when using it.It can be widely used to identify and analyze Semiconductor, FPD, Circuit encapsulation, circuit substrate, Material, Casting/Metal/Ceramic parts, Precision moulds and observe thicker specimen. High quality and reliable optical system brings much clearer and contrast image. The design meets with the ergonomics needs and makes you feel comfortable and relaxed in doing your job.

        Specification               
        Viewing Head   Compensation Free Trinocular Head, Inclined 30°(50mm-75mm)
        Eyepiece   WF10×/25mm
          WF10×/20mm,crosshair with reticule 0.1mm
        Objective Long working distance bright and dark field Infinite Plan objectives: 5 ×/0.1B.D/W.D.29.4mm 10×/0.25B.D/W.D.16mm  20×/0.40B.D/W.D.10.6mm 40 ×/0.60B.D/W.D.5.4mm
        Nosepiece   Quintuple Nosepiece with DIC Jack
        Stage   Double layer mechanical stage
          Stage Size: 190mm×140mm
          Moving Range:50mm×40mm
        Filter   Flashboard type filters(green,blue,neutral)
        Focusing Coaxial coarse &fine focusing adjustment With rack and pinion mechanism Fine focusing scale value 0.002mm
        Light Source With aperture iris diaphragm and field iris diaphragm, halogen Bulb 12V/50W,  AC85V-230 Brightness Adjustable
        Polarizing Device Analyzer rotatable 360,°Polarizer&Analyzer can be moved in/out of the optical path
        Checking Tool   0.01mm Micrometer
        Optional Accessory   Two-dimensional measurement software
          Professional metallurgical image analysis software
          Halogen Bulb 12V/100W
          Micrometer eyepiece
          1.3Mega,2.0 Mega,3.0 Mega,5.0 Mega pixels CMOS Digital camera eyepieces
        Long working distance bright & dark field Infinite Plan objectives: 50 ×/0.55B.D/W.D.5.1mm, 80×/0.75B.D/W.D.4mm,100×/0.80B.D/W.D.3mm
        Precision Stage:X-Y moving range 25mm×25mm,Moving Precision<5um,Digital hand wheel Min.Value:0.1um,360°Rotatable disc
          Photography attachment and CCD Adapter 0.5×,0.57×,0.75×
          DIC(10×,20×,40×,100×)
          Planishing tool
          CCD Camera,colour 1/3″High resolution 520 TV lines

        Characteristicsand description
         
        1.       UIS infinite-optical system.

        2.       Adopt long-life halogen light source with much higher light efficiency.

        3.       Bright and dark field, Polarization and differential interference function.

        4.       The aspherical Kohler illumination, increasing the brightness of observation.

        5.       WF10 ×(Φ25)Super wide viewing field Eyepiece, long working distance

                  metallurgical objective with bright and dark field

        6.       The Quintuple Nosepiece can be equipped with detachable DIC differential
                  interference device.
         
        DIC: Nomarski differential interference contrast observation is deemed to the essential means to checkout the materials, semiconductor and metal structure now.

        Interested in this product, please leave us a message

        Wechat:sunrainrose

        手机赚钱棋牌游戏